View monthly record counts
| Month | Records |
|---|---|
| 2 |
TRIPOD TECHNOLOG
SupplierCHINA TAIWAN
NO.1-3,ALLEY 5,LANE 305,SEC.1 SHIN-NAN RD, LU-CHU TAOYUAN 33845
Data updated:
Top 3 Export Trade Countries
View all on Tradesparq| # | Country / Region | Records |
|---|---|---|
| 1 | Malaysia | 2 |
Top 3 Export HS Codes
View all on Tradesparq| # | HS Code | Description (CN) | Description (EN) | Records |
|---|---|---|---|---|
| 1 | 903141 | 制造半导体器件（包括集成电路）时检验半导体晶圆、器件（包括集成电路）或检测光掩模及光栅用的光学仪器及器具 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 2 |
Top 3 Export Trading Partners
View all on Tradesparq| # | Partner Name | Country / Region | Records |
|---|---|---|---|
| 1 | VITROX TECHNOLOGIES SDN.BHD | MALAYSIA | 2 |
Latest Export Trade Record
View more records on Tradesparq| Date | Dec 19, 2025 | Bill No. | — | ||
|---|---|---|---|---|---|
| Supplier Information | Company Name | TRIPOD TECHNOLOG | Buyer Information | Company Name | VITROX TECHNOLOGIES SDN BHD |
| Address | — | Address | — | ||
| Registration No. | — | Registration No. | 507043P | ||
| Phone | — | Phone | — | ||
| — | — | ||||
| Product Information | HS Code | 90314100 | HS Description | 制造半导体器件（包括集成电路）时检验半导体晶圆、器件（包括集成电路）或检测光掩模及光栅用的光学仪器及器具For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | |
| Product Description | UPGRADE KIT (IPC UPGRADE PROCESSOR) | Brand | — | ||
| Quantity & Price | Amount | 1,441.76 | Weight | — | |
| Quantity | 2 UNT | TEU | — | ||
| Shipment Information | Origin Country | CHINA TAIWAN | Destination Country | MALAYSIA | |
| Port of Loading | — | Destination Port | PENANG | ||
| Loading Place | — | Transport Mode | AIR | ||
| Transaction Mode | — | Carrier | — | ||
| Vessel Name | — | Voyage | — | ||
| Container No. | — | Shipping Country | — | ||