View monthly record counts
| Month | Records |
|---|---|
| 2 |
Local name: FUTANI ENGINEERING PTE LTD
Data updated:
| Month | Records |
|---|---|
| 2 |
| # | Country / Region | Records |
|---|---|---|
| 1 | India | 2 |
| # | HS Code | Description (CN) | Description (EN) | Records |
|---|---|---|---|---|
| 1 | 903141 | 制造半导体器件(包括集成电路)时检验半导体晶圆、器件(包括集成电路)或检测光掩模及光栅用的光学仪器及器具 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 2 |
| # | Partner Name | Country / Region | Records |
|---|---|---|---|
| 1 | MICRON SEMICONDUCTOR TECHNOLOGY INDIA PRIVATE LIMI | INDIA | 2 |
| Date | Feb 24, 2024 | Bill No. | — | ||
|---|---|---|---|---|---|
| Supplier Information | Company Name | FUTANI ENGINEERING PTE | Buyer Information | Company Name | MICRON SEMICONDUCTOR TECHNOLOGY INDIA PRIVATE LIMI |
| Address | — | Address | — | ||
| Registration No. | — | Registration No. | AAQCM3409E | ||
| Phone | — | Phone | — | ||
| — | — | ||||
| Product Information | HS Code | 90314100 | HS Description | 制造半导体器件(包括集成电路)时检验半导体晶圆、器件(包括集成电路)或检测光掩模及光栅用的光学仪器及器具For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | |
| Product Description | VACCUM POROUS INSPECTION JIG | Brand | — | ||
| Quantity & Price | Amount | 3,120.00 | Weight | — | |
| Quantity | 1 NOS | TEU | — | ||
| Shipment Information | Origin Country | SINGAPORE | Destination Country | INDIA | |
| Port of Loading | — | Destination Port | — | ||
| Loading Place | — | Transport Mode | UNKNOWN | ||
| Transaction Mode | — | Carrier | — | ||
| Vessel Name | — | Voyage | — | ||
| Container No. | — | Shipping Country | — | ||