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TOHO ELECTRONICS INC
BuyerJAPAN
2-4-3 NISHIHASHIMOTO MIDORI-KU SAGAMIHARA-SHI KANAGAWA-KEN 252-0131 JAPAN JP
Data updated:
Top 3 Import Trade Countries
View all on Tradesparq| # | Country / Region | Records |
|---|---|---|
| 1 | Malaysia | 2 |
Top 3 Import HS Codes
View all on Tradesparq| # | HS Code | Description (CN) | Description (EN) | Records |
|---|---|---|---|---|
| 1 | 903141 | 制造半导体器件（包括集成电路）时检验半导体晶圆、器件（包括集成电路）或检测光掩模及光栅用的光学仪器及器具 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 2 |
Top 3 Import Trading Partners
View all on Tradesparq| # | Partner Name | Country / Region | Records |
|---|---|---|---|
| 1 | NABELIN MALAYSIA SDN BHD | MALAYSIA | 2 |
Latest Import Trade Record
View more records on Tradesparq| Date | Feb 26, 2026 | Bill No. | — | ||
|---|---|---|---|---|---|
| Supplier Information | Company Name | NABELIN MALAYSIA SDN BHD | Buyer Information | Company Name | TOHO ELECTRONICS INC |
| Address | F-1-3, JALAN C180/1,DATARAN C180, | Address | — | ||
| Registration No. | 966893D | Registration No. | — | ||
| Phone | — | Phone | — | ||
| — | — | ||||
| Product Information | HS Code | 90314100 | HS Description | 制造半导体器件（包括集成电路）时检验半导体晶圆、器件（包括集成电路）或检测光掩模及光栅用的光学仪器及器具For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | |
| Product Description | PROBE CARD GAT-1 | Brand | — | ||
| Quantity & Price | Amount | 132.04 | Weight | — | |
| Quantity | 4 UNT | TEU | — | ||
| Shipment Information | Origin Country | MALAYSIA | Destination Country | JAPAN | |
| Port of Loading | KUALA LUMPUR | Destination Port | TYOJP | ||
| Loading Place | — | Transport Mode | AIR | ||
| Transaction Mode | — | Carrier | — | ||
| Vessel Name | — | Voyage | — | ||
| Container No. | — | Shipping Country | — | ||